Author

Dong Yeob Shin, Min Jung Kim, Jinyoung Go, Hyunmin Hong, Teklebrahan Gebrekrstos Weldemhret, Kwangsik Jeong, and Kwun-Bum Chung

Journal

ACS Applied Electronic Materials

Vol

7

Page

2928-2938

Year

2025

File

evolution-of-defect-states-within-the-band-gap-of-indium-tin-zinc-oxide-thin-film-transistors-using-the-quantitative.pdf (5.6M) 3회 다운로드 DATE : 2025-12-19 11:21:08