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2025 Evaluation of the High Mobility and Stability of InGaZnO/InSnZnO Bilayer Thin-Film Transistors via Quantitative Defect Analysis

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Author: Dong-Joon Yi, Teklebrahan Gebrekrstos Weldemhret, Kwangsik Jeong, Kwun-Bum Chung

Journal: Surface and Interface

Vol: 71

Page: 106870

Year: 2025

File: 1-s2.0-S2468023025011265-main.pdf (3.3M) 0회 다운로드 DATE : 2025-12-19 12:56:56

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