Publication

Journal

2025 Investigation of Chlorine-Induced Damage in Oxide Semiconductor Transistors

본문

Author
Jae Won Na, Seungbin Lee, Hyeonhong Min, Gwanghyeon Jang, Minseop Song, I. Sak Lee, Jong-Heon Yang, Min Jung Kim, Kwun-Bum Chung and Si Joon Kim
Journal
ACS Applied Electronic Materials
Vol
7
Page
6128-6136
Year
2025
File
investigation-of-chlorine-induced-damage-in-oxide-semiconductor-transistors.pdf (5.5M) 0회 다운로드 DATE : 2025-12-19 11:18:26


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