The correlation between electrical properties and quantitative defect analysis as a function of electrode junction type of amorphous indium tin zinc oxide thin film transistor
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작성일 2024-10-28 10:42 조회 68회 댓글 0건
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The correlation between electrical properties and quantitative defect analysis as a function of electrode junction type of amorphous indium tin zinc oxide thin film transistor
신동엽
AMSM
대한민국 인천
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