Amorphous indium-tin-zinc oxide thin film transistor correlation between electrical properties and defect analysis as a function of conductive homojunction layer insertion electrode
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작성일 2024-11-13 10:49 조회 70회 댓글 0건
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Amorphous indium-tin-zinc oxide thin film transistor correlation between electrical properties and defect analysis as a function of conductive homojunction layer insertion electrode
신동엽
MNC
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