[SCI 논문 게재] IEEE TRANSACTIONS ON ELECTRON DEVICES

2016.07.22 13:50

APEL 조회 수:58

 

Title : Reliability of Crystalline Indium-Gallium-Zinc-Oxide Thin Film Transistors under Bias Stress with Light Illumination

Author : Kyung Park, Hyun-Woo Park, Hyun Soo Shin, Jonguk Bae, Kwon-Shik Park, Inbyeong Kang, Kwun-Bum Chung, and Jang-Yeon Kwon

Journal : IEEE TRANSACTIONS ON ELECTRON DEVICES 62(9), 2900 (2015).

 

댓글 0

문서 첨부 제한 : 0Byte/ 2.00MB
파일 크기 제한 : 2.00MB (허용 확장자 : *.*)
 
목록
번호 제목 글쓴이 날짜 조회 수
24 [SCI 논문 게재] Journal of Electronics Materials APEL 2017.05.01 119
23 [SCI 논문 게재] Journal of Electronics Materials APEL 2017.05.01 158
22 [SCI 논문 게재] IEEE Transactions on Electron Devices APEL 2017.03.30 118
21 [SCI 논문 게재] Applied Physics Express APEL 2016.12.22 111
20 [SCI 논문 게재] Japanese Journal of Applied Physics APEL 2016.12.22 118
19 [SCI 논문 게재] Applied Materials & Interfaces APEL 2016.12.22 116
18 [SCI 논문 게재] Applied Physics Letters APEL 2016.12.22 112
17 [SCI 논문 게재] Ceramics International APEL 2016.07.22 1464
16 [SCI 논문 게재] Journal of the Korean Physics Society APEL 2016.07.22 315
15 [SCI 논문 게재] Scientific Reports APEL 2016.07.22 88
14 [SCI 논문 게재] Scientific Reports APEL 2016.07.22 87
13 [SCI 논문 게재] Journal of the Korean Physical Society APEL 2016.07.22 74
12 [SCI 논문 게재] Applied Surface Science APEL 2016.07.22 242
11 [SCI 논문 게재] Organic Electronics APEL 2016.07.22 45
10 [SCI 논문 게재] Applied Surface Science APEL 2016.07.22 148
9 [SCI 논문 게재] Applied Physics Express APEL 2016.07.22 52
» [SCI 논문 게재] IEEE TRANSACTIONS ON ELECTRON DEVICES APEL 2016.07.22 58
7 [SCI 논문 게재] ACS Applied Materials & Interfaces APEL 2016.07.22 76
6 [SCI 논문 게재] Journal of Electroceramics APEL 2016.07.22 117
5 [SCI 논문 게재] Journal of Materials Chemistry C APEL 2016.07.22 86